Event pileup in charge-coupled devices

被引：323

作者：

Davis, JE ^{[1
]}

机构：

[1] MIT, Ctr Space Res, Chandra Xray Ctr, Cambridge, MA 02139 USA

来源：

ASTROPHYSICAL JOURNAL | 2001年 / 562卷 / 01期

关键词：

instrumentation : detectors; methods : analytical; methods : data analysis; X-rays : general;

D O I：

10.1086/323488

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The problem of event pileup in single-photon-counting CCD cameras (e.g., in the X-ray regime) is discussed, and a solution to the problem is proposed. The resulting pileup equation includes the effects of grade migration and presents itself as a nonlinear modification to the standard integral equation used by forward-folding spectral-fitting programs. The effectiveness of the model is demonstrated by its application to the moderately piled zeroth-order data obtained by the Chandra X-Ray Observatory for the quasar S5 0836 + 7104.

引用

页码：575 / 582

页数：8

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