Multilayer optical storage by low-coherence reflectometry

被引：15

作者：

Chinn, SR

Swanson, EA

机构：

[1] Lincoln Laboratory, Massachusetts Inst. of Technology, Lexington, MA 02173-9108

来源：

OPTICS LETTERS | 1996年 / 21卷 / 12期

关键词：

D O I：

10.1364/OL.21.000899

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We propose and analyze the use of optical coherence domain reflectometry (OCDR) in multilayer optical storage, permitting higher data density and detection sensitivity with lower interlayer cross talk and scattering. An experimental OCDR image of data on a CD-ROM is compared with an image obtained with direct detection. (C) 1996 Optical Society of America

引用

页码：899 / 901

页数：3