Identification of mercury reaction sites in fluorescent lamps

被引:22
作者
Dang, TA [1 ]
Frisk, TA
Grossman, MW
Peters, CH
机构
[1] OSRAM Sylvania, Chem & Met Prod Res & Dev, Towanda, PA 18848 USA
[2] OSRAM Sylvania, Lighting Res Ctr, Beverly, MA 01915 USA
关键词
D O I
10.1149/1.1392569
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The interaction between Hg and components in fluorescent lamps was studied using electron spectroscopy for chemical analysis (ESCA) and sputtered neutral mass spectrometry (SNMS). Active sites, which were responsible for Hg interaction/deposition, were identified by comparison of the X-Y distribution (obtained by ESCA mapping) and depth distribution (available through SNMS) of respective lamp components with that of Hg. These results showed that Hg strongly interacted with Na (from glass) and the emitter components, especially Ba. in the case of lamps with a tin oxide conductive film, the film was also a source for interaction. Exact assignment of the oxidation state for the interacted Hg species was not certain due to a small variation in binding energy shift among the Hg compounds. However, the data suggested an Hg(0) state. It was possible that most of the Hg species strongly chemisorbed onto Ba (and/or Sr) and Na sites or formed intermetallic compounds with these elements. (C) 1999 The Electrochemical Society. S0013-4651(99)03-097-9. All rights reserved.
引用
收藏
页码:3896 / 3902
页数:7
相关论文
共 19 条
[1]   BARIUM-MERCURY SYSTEM [J].
BRUZZONE, G ;
MERLO, F .
JOURNAL OF THE LESS-COMMON METALS, 1975, 39 (02) :271-276
[2]   STRONTIUM-MERCURY SYSTEM [J].
BRUZZONE, G ;
MERLO, F .
JOURNAL OF THE LESS-COMMON METALS, 1974, 35 (01) :153-157
[3]   Depth resolution advantages of plasma sputtering in depth profiling of conductive and non-conductive materials [J].
Dang, TA ;
Frisk, TA .
SURFACE & COATINGS TECHNOLOGY, 1998, 106 (01) :60-65
[4]  
Dang TA, 1996, SURF INTERFACE ANAL, V24, P86, DOI 10.1002/(SICI)1096-9918(199602)24:2<86::AID-SIA68>3.0.CO
[5]  
2-R
[6]   MERCURY-GLASS INTERACTIONS IN FLUORESCENT LAMPS [J].
DOUGHTY, DA ;
WILSON, RH ;
THALER, EG .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (10) :3542-3550
[7]   Effect of radiation transport on the kinetics of phosphor degradation [J].
Grossman, MW .
JOURNAL OF APPLIED PHYSICS, 1998, 84 (03) :1251-1262
[8]  
Matsuo K., 1997, National Technical Report, V43, P82
[9]  
Moulder J.F., 1995, HDB XRAY PHOTOELECTR
[10]   MECHANISM OF THE DARKENING OF SODA-LIME GLASS BY A LOW-PRESSURE MERCURY-VAPOR DISCHARGE [J].
MULDER, BJ ;
VANHEUSDEN, S .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 63 (01) :137-141