The effect of target density and its morphology on TiO2 thin films grown on Si(100) by PLD

被引:108
作者
Kim, JH
Lee, S
Im, HS
机构
[1] Kwang Ju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju, South Korea
[2] Korea Res Inst Stand & Sci, Surface Anal Grp, Taejon 305600, South Korea
关键词
pulsed laser deposition; particulate; TiO2; target preparation;
D O I
10.1016/S0169-4332(99)00269-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Pure titanium dioxide (TiO2) thin films were deposited on single crystal Si(100) substrates by pulsed laser deposition (PLD). We investigated the effect of ambient gas (O-2 or Ar) and temperature on film quality. High quality TiO2 thin films were grown under low ambient pressures of oxygen and high substrate temperatures. The rutile phase is dominant under most experimental conditions. Only under very extreme conditions did we obtain thin films of the anatase phase. In relation to particulate problems, we investigated the effects of target morphology and target density on the sizes and the distribution densities of the particulates formed in the deposited thin film. Using a dense target and making laser shots to the point where the target surfaces begin to show a clear ripple pattern, we obtained nearly particulate-free thin film. It is desirable to monitor the morphology of both the target and the growing thin films to obtain the highest quality thin films. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:6 / 16
页数:11
相关论文
共 18 条
[1]   Effect of growth conditions on formation of TiO2-II thin films in atomic layer deposition process [J].
Aarik, J ;
Aidla, A ;
Sammelselg, V ;
Uustare, T .
JOURNAL OF CRYSTAL GROWTH, 1997, 181 (03) :259-264
[2]   RUTILE - NORMAL PROBABILITY PLOT ANALYSIS AND ACCURATE MEASUREMENT OF CRYSTAL STRUCTURE [J].
ABRAHAMS, SC ;
BERNSTEI.JL .
JOURNAL OF CHEMICAL PHYSICS, 1971, 55 (07) :3206-&
[3]   INVESTIGATIONS OF TIO2 FILMS DEPOSITED BY DIFFERENT TECHNIQUES [J].
BANGE, K ;
OTTERMANN, CR ;
ANDERSON, O ;
JESCHKOWSKI, U ;
LAUBE, M ;
FEILE, R .
THIN SOLID FILMS, 1991, 197 (1-2) :279-285
[4]  
CHASTAIN J, 1992, HDB XRAY PHOTOELECTR, P72
[5]   ELECTRICAL AND OPTICAL PROPERTIES OF RUTILE SINGLE CRYSTALS [J].
CRONEMEYER, DC .
PHYSICAL REVIEW, 1952, 87 (05) :876-886
[6]  
Cullity BD, 1978, ELEMENTS XRAY DIFFRA
[7]   FABRICATION OF TITANIUM-OXIDE THIN-FILMS BY CONTROLLED GROWTH WITH SEQUENTIAL SURFACE CHEMICAL-REACTIONS [J].
KUMAGAI, H ;
MATSUMOTO, M ;
TOYODA, K ;
OBARA, M ;
SUZUKI, M .
THIN SOLID FILMS, 1995, 263 (01) :47-53
[8]   ATOMIC LAYER GROWTH OF TIO2 ON SILICA [J].
LAKOMAA, EL ;
HAUKKA, S ;
SUNTOLA, T .
APPLIED SURFACE SCIENCE, 1992, 60-1 :742-748
[9]   ELECTRICAL-CONDUCTIVITY OF PLASMA-SPRAYED TITANIUM-OXIDE (RUTILE) COATINGS [J].
OHMORI, A ;
PARK, KC ;
INUZUKA, M ;
ARATA, Y ;
INOUE, K ;
IWAMOTO, N .
THIN SOLID FILMS, 1991, 201 (01) :1-8
[10]   A LOW-COST, HIGH-EFFICIENCY SOLAR-CELL BASED ON DYE-SENSITIZED COLLOIDAL TIO2 FILMS [J].
OREGAN, B ;
GRATZEL, M .
NATURE, 1991, 353 (6346) :737-740