Slip line analysis in Ni3Al by atomic force microscopy

被引：11

作者：

Coupeau, C

Bonneville, J

Matterstock, B

Grilhé, J

Marti, JL

机构：

[1] Univ Poitiers, URA CNRS 131, Met Phys Lab, F-86960 Futuroscope, France

[2] Ecole Polytech Fed Lausanne, Dept Phys 1015, CH-1015 Lausanne, Switzerland

来源：

SCRIPTA MATERIALIA | 1999年 / 41卷 / 09期

关键词：

AFM; slip traces; cross-slip; Ni3Al; single crystal;

D O I：

10.1016/S1359-6462(99)00244-4

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Slip traces were examined by AFM on an Ni3(Al,Ta) single crystal pre-deformed at room temperature. Short cross-slip traces on the cube cross-slip plane were not directly observed by AFM imaging. Contrary to this, large cross slip traces were observed. An overall feature was the presence of numerous short slip traces.

引用

页码：945 / 950

页数：6

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