Role of impact ionization in multiple exciton generation in PbSe nanocrystals

被引:116
作者
Allan, G. [1 ]
Delerue, C. [1 ]
机构
[1] Dept ISEN, Inst Elect Microelect & Nanotechnol, CNRS, UMR 8520, F-59046 Lille, France
来源
PHYSICAL REVIEW B | 2006年 / 73卷 / 20期
关键词
D O I
10.1103/PhysRevB.73.205423
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the impact ionization process, a hot carrier relaxes by generating an exciton. We present tight binding calculations showing that the rate of this process in PbSe nanocrystals has a strong energy dependence and that the relaxation energy increases linearly with the carrier excess energy. The impact ionization can be extremely fast (similar to fs) but it is not enhanced by the confinement in contrast to the usual belief. It explains the multiple exciton generation observed experimentally in these dots except at high photon energy where more complex many-particle phenomena are involved.
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页数:5
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