YSZ buffer layers on large technical substrates

被引:10
作者
Dzick, J
Wiesmann, J
Hoffmann, J
Heinemann, K
Garcia-Moreno, F
Isaev, A
Freyhardt, HC
Lechner, W
机构
[1] Univ Gottingen, Inst Mat Phys, D-37073 Gottingen, Germany
[2] Zent Funkt Werkstoffe, D-37073 Gottingen, Germany
[3] Kabelmet Electro GmbH, D-30179 Hannover, Germany
关键词
D O I
10.1109/77.784917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The ion-beam-assisted deposition (IBAD) of yttria-stabilized zirconia (YSZ) films was extended to large technical substrates such as ceramic plates, metallic tapes and metallic tubes to serve as templates for high-current carrying Y-Ba-Cu-O films. These YSZ films are deposited,vith dual-Kaufman-ion-source equipment. The coating of technical substrates large in comparison to the ion sources requires special measures to provide YSZ films of homogeneous texture quality. With respect to the special growth mechanism of YSZ, a homogenization of the in-plane texture can be achieved by simple movement of the substrate. Up to now we have been able to produce YSZ films on ceramic substrates (10 cm x 10 cm) with a homogeneous in-plane texture of 17 degrees FWHM and on a Ni-tape (1 cm x 50 cm) with a FWHM of 21 degrees, The main aspects of the growth mechanism the influence of the nucleation, the improvement of texture with increasing film thickness and homoepitaxial effects and the surface morphology are investigated in detail with transmission electron microscopy (TEM) and atomic force microscopy(AFM).
引用
收藏
页码:2248 / 2251
页数:4
相关论文
共 12 条
[1]  
Dzick J, 1997, INST PHYS CONF SER, P1001
[2]   Y-123 films on technical substrates [J].
Freyhardt, HC ;
Hoffmann, J ;
Wiesmann, J ;
Dzick, J ;
Heinemann, K ;
Issaev, A ;
Usoskin, A ;
Garcia-Moreno, F .
APPLIED SUPERCONDUCTIVITY, 1996, 4 (10-11) :435-446
[3]   High critical current density superconducting tapes by epitaxial deposition of YBa2Cu3Ox thick films on biaxially textured metals [J].
Goyal, A ;
Norton, DP ;
Budai, JD ;
Paranthaman, M ;
Specht, ED ;
Kroeger, DM ;
Christen, DK ;
He, Q ;
Saffian, B ;
List, FA ;
Lee, DF ;
Martin, PM ;
Klabunde, CE ;
Hartfield, E ;
Sikka, VK .
APPLIED PHYSICS LETTERS, 1996, 69 (12) :1795-1797
[4]  
HASEGAWA K, 1996, P ICEC 16 SAPP JAP, P21
[5]   Biaxially textured yttria stabilized zirconia buffer layers on rotating cylindrical surfaces [J].
Hoffmann, J ;
Dzick, J ;
Wiesmann, J ;
Heinemann, K ;
GarciaMoreno, F ;
Freyhardt, HC .
JOURNAL OF MATERIALS RESEARCH, 1997, 12 (03) :593-595
[6]   BIAXIALLY ALIGNED YBA2CU3O7-X THIN-FILM TAPES [J].
IIJIMA, Y ;
TANABE, N ;
IKENO, Y ;
KOHNO, O .
PHYSICA C, 1991, 185 :1959-1960
[7]  
IIJIMA Y, 1998, IN PRESS J MAT RES, V11
[8]   The crossover of preferred orientation in TiN film growth: A real time x-ray scattering study [J].
Je, JH ;
Noh, DY ;
Kim, HK ;
Liang, KS .
JOURNAL OF MATERIALS RESEARCH, 1997, 12 (01) :9-12
[9]  
Wiesmann J, 1997, INST PHYS CONF SER, P997
[10]  
WIESMANN J, 1998, IN PRESS J MAT RES, V11