Chemical force microscopy of cellulosic fibers

被引:54
作者
Bastidas, JC
Venditti, R
Pawlak, J
Gilbert, R
Zauscher, S
Kadla, JF
机构
[1] Univ British Columbia, Fac Forestry, Vancouver, BC V6T 1Z4, Canada
[2] Duke Univ, Dept Mech Engn & Mat Sci, Durham, NC 27706 USA
[3] N Carolina State Univ, Dept Pulp & Paper Sci, Raleigh, NC 27695 USA
关键词
atomic force microscopy (AFM); chemical force microscopy (CFM); SAMS; XPS; cellulose fibers; cellulose film; pull-off forces; adhesion forces;
D O I
10.1016/j.carbpol.2005.08.058
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Atomic force microscopy with chemically modified cantilever tips (chemical force microscopy) was used to study the pull-off forces (adhesion forces) on cellulose model surfaces and bleached softwood kraft pulp fibers in aqueous media. It was found that for the -COOH terminated tips, the adhesion forces are dependent on pH, whereas for the -CH3 and -OH terminated tips adhesion is not strongly affected by pH. Comparison between the cellulose model surfaces and cellulosic fibers under our experimental conditions reveal that surface roughness does not affect adhesion strongly. X-ray photoelectron spectroscopy (XPS) and Fourier Transformed Infrared (FTIR) spectroscopy reveal that both substrate surfaces have homogeneous chemical composition. The results show that chemical force microscopy can be used for the chemical characterization of cellulose surfaces at a nano-level. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:369 / 378
页数:10
相关论文
共 48 条
[1]  
BABCOCK KL, 1995, PHASE IMAGING TOPOGR, P1
[2]  
Beamson G., 1992, ADV MATER, DOI DOI 10.1002/ADMA.19930051035
[3]   Surface composition and morphology of CTMP fibers [J].
Börås, L ;
Gatenholm, P .
HOLZFORSCHUNG, 1999, 53 (02) :188-194
[4]   Force-distance curves by atomic force microscopy [J].
Cappella, B ;
Dietler, G .
SURFACE SCIENCE REPORTS, 1999, 34 (1-3) :1-+
[5]  
Dorris G.M., 1978, CELL CHEM TECHNOL, V12, P9
[6]   Mapping aging effects on polymer surfaces: Specific detection of additives by chemical force microscopy [J].
Duwez, AS ;
Nysten, B .
LANGMUIR, 2001, 17 (26) :8287-8292
[7]   Chemical recognition of antioxidants and UV-light stabilizers at the surface of polypropylene: Atomic force microscopy with chemically modified tips [J].
Duwez, AS ;
Poleunis, C ;
Bertrand, P ;
Nysten, B .
LANGMUIR, 2001, 17 (20) :6351-6357
[8]   DEPTH PROFILING OF A PHOTOCHEMICALLY YELLOWED PAPER .2. FT-IR TECHNIQUES [J].
FORSSKAHL, I ;
KENTTA, E ;
KYYRONEN, P ;
SUNDSTROM, O .
APPLIED SPECTROSCOPY, 1995, 49 (02) :163-170
[9]   Detachment of particles from surfaces: An AFM study [J].
Freitas, AM ;
Sharma, MM .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2001, 233 (01) :73-82
[10]  
Furuta T, 1998, J PULP PAP SCI, V24, P320