Automated, low-temperature dielectric relaxation apparatus for measurement of air-sensitive, corrosive, hygroscopic, powdered samples

An automated apparatus for dielectric determinations on solid samples was designed to allow cryogenic measurements on air-sensitive, corrosive, hygroscopic, powdered samples, without determination of sample thickness, provided that it is uniform. A three-terminal design enabled measurements that were not affected by errors due to dimensional changes of the sample or the electrodes with changes in temperature. Meaningful dielectric data could be taken over the frequency range from 20 Hz to 1 MHz and the temperature range from 12 to 360 K. Tests with Teflon and with powdered NH4Cl gave results that were accurate within a few percent when compared with literature values. (C) 1999 American Institute of Physics. [S0034-6748(99)00107-0].