Submicrometer p-type SiGe modulation-doped field-effect transistors for high speed applications

被引:9
作者
Adesida, I
Arafa, M
Ismail, K
Chu, JO
Meyerson, BS
机构
[1] UNIV ILLINOIS,DEPT ELECT & COMP ENGN,URBANA,IL 61801
[2] CAIRO UNIV,FAC ENGN,DEPT ELECT,GIZA 12211,EGYPT
[3] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
基金
美国国家科学基金会;
关键词
D O I
10.1016/S0167-9317(96)00088-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Excellent improvement in the hole transport properties for SiGe heterostructures promises symmetric, higher speed, and lower power consumption circuits compared to conventional Si CMOS devices. Modulation-doped field effect transistors (MODFETs) grown on a relaxed Si0.7Ge0.3 buffer have been fabricated using a self-aligned gate process. The p-type devices had gate lengths ranging from 1.0 mu m down to 0.1 mu m A record unity current gain cutoff frequency f(T) of 70 GHz was obtained for 0.1 mu m gate-length devices.
引用
收藏
页码:257 / 260
页数:4
相关论文
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