Detector systems for use with an Electron Beam Ion Trap

被引：17

作者：

Currell, FJ

Asada, J

Fukami, T

Hirayama, H

Nakamura, N

Motohashi, K

Nojikawa, E

Okazaki, K

Ohtani, S

Sakurai, M

Shiraishi, H

Tsurubuchi, S

Watanabe, H

机构：

[1] GAKUSHUIN UNIV,TOKYO 171,JAPAN

[2] TOKYO UNIV AGR & TECHNOL,KOGANEI,TOKYO 184,JAPAN

[3] RIKEN,INST PHYS & CHEM RES,WAKO,SAITAMA 35101,JAPAN

[4] KOBE UNIV,KOBE,HYOGO 657,JAPAN

[5] KYOTO UNIV,KYOTO 60601,JAPAN

来源：

PHYSICA SCRIPTA | 1997年 / T73卷

关键词：

D O I：

10.1088/0031-8949/1997/T73/122

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

This article describes two data systems, primarily for use with X-ray detectors in conjunction with an Electron Beam Ion Trap (EBIT). Both systems are designed from a common viewpoint that useful information should be presented in real-time whilst as much information as possible should be stored for subsequent off-line analysis.

引用

页码：371 / 372

页数：2

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