Luminescence of Tb ions implanted into amorphous AlN thin films grown by sputtering

被引:55
作者
Jadwisienczak, WM [1 ]
Lozykowski, HJ
Perjeru, F
Chen, H
Kordesch, M
Brown, IG
机构
[1] Ohio Univ, Sch Elect Engn & Comp Sci, Stocker Ctr, Athens, OH 45701 USA
[2] Ohio Univ, Dept Phys & Astron, Clippinger Labs, Athens, OH 45701 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
关键词
D O I
10.1063/1.126652
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the observation of visible cathodoluminescence (CL) of Tb ions implanted into amorphous AIN films produced by sputtering. The implanted samples, were subjected to thermal annealing treatment up to 1100 degrees C to optically activate the incorporated ions. The results show that up to 1000 degrees C annealing temperature the films remain amorphous and the Tb3+ emission intensity increases. The amorphous AIN:Tb films were characterized by x-ray diffraction, CL, and CL kinetics measurements. The sharp characteristic emission lines corresponding to intra-4f(n)-shell transitions are resolved in the spectral range from 350 to 750 nm, and observed over the temperature range from 7 to 330 K due to the transitions from D-5(3) and D-5(4) levels reward the F-5(J) (J = 2 to 6) multiplets. Finally, CL kinetics measurements have revealed that decay times of D-3(3) -->F-7(J) and D-5(4)-->F-7(J) transitions are in the range 0.94-0.77 and 0.49-1.61 ms at 300 K, respectively. (C) 2000 American Institute of Physics. [S0003-6951(00)02223-3].
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页码:3376 / 3378
页数:3
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