An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST

被引：77

作者：

Lee, Yong-Gil

Lee, Jeong-Dong

Song, Yong-Il

Lee, Se-Jun

机构：

[1] Korea Adv Inst Sci & Technol, Strateg Planning Div, Seoul 130650, South Korea

[2] Seoul Natl Univ, Techno Econ & Policy Program, Seoul 151, South Korea

[3] Minist Sci & Technol, Technol Innovat Evaluat Bur, Anyang, South Korea

来源：

SCIENTOMETRICS | 2007年 / 70卷 / 01期

关键词：

D O I：

10.1007/s11192-007-0102-z

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Patent citation counts represent an aspect of patent quality and knowledge flow. Especially, citation data of US patents contain most valuable pieces of the information among other patents. This paper identifies the factors affecting patent citation counts using US patents belonging to Korea Institute of Science and Technology (KIST). For patent citation count model, zero-inflated models are announced to handle the excess zero data. For explanatory factors, research team characteristics, invention-specific characteristics, and geographical domain related characteristics are suggested. As results, the size of invention and the degree of dependence upon Japanese technological domain significantly affect patent citation counts of KIST.

引用

页码：27 / 39

页数：13

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