Secondary ion mass spectrometry of sodium nitrate: Comparison of ReO4- and Cs+ primary ions

被引:46
作者
Groenewold, GS
Delmore, JE
Olson, JE
Appelhans, AD
Ingram, JC
Dahl, DA
机构
来源
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1997年 / 163卷 / 03期
关键词
secondary ion mass spectrometry; perrhenate; cesium; sputter yield; disappearance cross section;
D O I
10.1016/S0168-1176(97)00017-7
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
The use of perrhenate (rhenium tetroxide, ReO4-) as a bombarding particle was compared with Cs+ for its ability to generate molecular species from sodium nitrate. The purpose of the study was to quantitatively evaluate the enhancement in sputtering to be gained using a heavy, polyatomic primary particle. It was found that ReO4- is three to five times more efficient at generating ions such as Na2NO3+ and Na(NO3)(2)(-). The nitrate-bearing molecular ions were observed to decrease in intensity as primary ion dose increases; at the same time, nitrite-bearing ions were observed to increase. This observation is interpreted in terms of beam damage to the surface of the target. Disappearance cross sections (sigma) using ReO4- bombardment were measured as 960 and 690 Angstrom(2) for Na2NO3+ and Na(NO3)(2)(-), respectively. sigma values measured using Cs+ bombardment were slightly larger. These measurements show that for an equivalent area of the sample disrupted, ReO4- is more effective for the production of nitrate-bearing secondary ions, which increases the probability of completing a measurement before extensive beam damage occurs. Secondary ion energies were evaluated and shown to be comparable for the ReO4- and Cs+ bombardment experiments; for this reason, sample charging is not deemed to be a significant factor in these experiments. (C) 1997 Elsevier Science B.V.
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收藏
页码:185 / 195
页数:11
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