Comparison of Nanoscaled and Bulk NiO Structural and Environmental Characteristics by XRD, XAFS, and XPS

被引:663
作者
Peck, Matthea A.
Langell, Marjorie A. [1 ]
机构
[1] Univ Nebraska, Dept Chem, Lincoln, NE 68588 USA
基金
加拿大自然科学与工程研究理事会; 美国国家科学基金会;
关键词
nickel oxide; NiO; nanoparticles; XRD; XAFS; XPS; lattice contraction; transition-metal oxides; hydroxylation; X-RAY; NANOPARTICLES; SPECTROSCOPY; DEPENDENCE; ROUTE; MICROSTRUCTURE; NANOSTRUCTURES; PHOTOEMISSION; DEFECTS; SPECTRA;
D O I
10.1021/cm300739y
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
NiO has been analyzed by X-ray diffraction (XRD), X-ray absorption fine structure (XAFS) analysis, and X-ray photoelectron spectroscopy (XPS) for bulk-scale and nanosized polycrystalline samples. XAFS indicates that the 5- and 25-nm NiO materials show bulk-like structural properties, with the exception of a lattice contraction, relative to the bulk material, and exhibit the anticipated decrease in average coordination numbers typically observed for nanoparticle systems. Carefully calibrated high-resolution XRD measurements confirm the lattice contraction for the nanoparticles. XPS also indicates the surface of NiO is comparable across the size scale for both binding energies and characteristic Ni 2p satellite structure. Detailed examination of the Ni 2p and O 1s regions reveals that hydroxylation upon prolonged exposure to the ambient causes a noticeable change in the Ni 2p peak shape that could be misinterpreted as an artifact of particle size.
引用
收藏
页码:4483 / 4490
页数:8
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