Implement of a CCD spectrometer as experimental set-up to evaluate the emission of an electroluminescent device using the Taguchi methodology

被引:2
作者
Del Caño, t
Sansano, A
Rodríguez-Pérez, MA
González, A
de Saja, JA
机构
[1] Univ Valladolid, Fac Sci, Dept Condensed Matter Phys, E-47011 Valladolid, Spain
[2] Univ Valladolid, Sch Ind Engn, E-47011 Valladolid, Spain
关键词
electroluminescence; TFEL; CCD spectrometer; Taguchi method; control and noise factors; ANOVA;
D O I
10.1016/j.measurement.2003.09.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Taguchi methodology was applied to study the influence of the electrical field variables on the emission yield and spectral response of a standard ZnS-based thin film electroluminescent device (TFEL). A measurement set-up based on a CCD spectrometer was designed and different TFEL working regimes were applied. As a result of the statistical analysis the optimal operation conditions were established and the influence of the external measurement factors were minimized. (C) 2003 Elsevier Ltd. All rights reserved.
引用
收藏
页码:257 / 268
页数:12
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