Matched excitation energy comparison of the pulse and lock-in thermography NDE techniques

被引:161
作者
Pickering, Simon [1 ]
Almond, Darryl [1 ]
机构
[1] Univ Bath, UK Res Ctr NDE, Dept Mech Engn, Bath BA2 7AY, Avon, England
基金
英国工程与自然科学研究理事会;
关键词
infrared thermography; thermal imaging; thermal wave methods;
D O I
10.1016/j.ndteint.2008.05.007
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The defect detection capabilities of pulse transient thermography and lock-in thermography were compared using equal excitation energies. A signal-to-noise ratio analysis was performed on defect images obtained by the two techniques. The test piece imaged by both techniques was a carbon fibre composite plate containing back-drilled flat-bottomed hole artificial defects of 4, 6 and 12mm diameters at depths ranging from 0.25 to 3.5 mm. Similar limits of defect detection were found for the two techniques. Lock-in thermography phase images were found to exhibit anomalous switches between positive and negative phase values for different modulation frequencies and for different combinations of defect diameter and depth. This effect resulted in values of defect phase response that differed substantially from the one-dimensional thermal wave interpretation of lock-in thermography imaging. The consequences of this anomalous effect and its physical origins are discussed. (c) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:501 / 509
页数:9
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