Preparation and femtosecond third-order nonlinear optical properties of Cu/SiO2 composite thin films

被引:20
作者
Tanahashi, I [1 ]
Inouye, H
Tanaka, K
Mito, A
机构
[1] Matsushita Elect Ind Co Ltd, Cent Res Labs, Kyoto 6190237, Japan
[2] JST, ERATO, HIrao Act Glass Project, Kyoto 6190237, Japan
[3] Kyoto Univ, Grad Sch Sci, Dept Phys, Sakyo Ku, Kyoto 6068224, Japan
[4] Natl Res Lab Metrol, Tsukuba, Ibaraki 3050045, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 9A期
关键词
Cu particle; third-order optical nonlinearity; Z-scan; pump-probe method;
D O I
10.1143/JJAP.38.5079
中图分类号
O59 [应用物理学];
学科分类号
摘要
A multitarget sputtering method was applied to embed Cu particles in SiO2 glass thin films (Cu/SiO2 films) with a high concentration of Cu particles (18 at.%). In the optical-absorption spectra of the as-deposited Cu/SiO2 films, the absorption peak due to the surface plasmon resonance of Cu particles was observed around 580 nm. The imaginary part of the third-order nonlinear susceptibility, \Im[chi((3))]\, exhibited a peak at the absorption peak, and the maximum value was estimated to be 1.8 x 10(-10) esu in the femtosecond time region. The nonlinear response time derived from the recovery time of the nonlinear absorption of the film was estimated to be 1.4 ps at the absorption peak of the surface plasmon.
引用
收藏
页码:5079 / 5082
页数:4
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