Experimental evidence for nanoparticle deposition in continuous argon-silane plasmas: Effects of silicon nanoparticles on film properties

被引:91
作者
Cabarrocas, PR
Gay, P
Hadjadj, A
机构
[1] Lab. Phys. Interfaces Couches Minces, Ecole Polytechnique
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1996年 / 14卷 / 02期
关键词
D O I
10.1116/1.580162
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
These last few years a great effort has been made to understand the mechanisms of powder formation in silane discharges. It is now well established that powders are negatively charged and thus confined in the plasma. Therefore, one does not expect powders to contribute to the deposition, unless the plasma is switched off. We present here experimental evidence for the deposition of nanoparticles, even in the case of a continuous discharge. Experimental conditions for nanoparticle formation while avoiding powder formation have been determined from light-scattering and transmission electron microscopy measurements. Nanoparticle deposition has been studied by in situ ellipsometry in silane-argon discharges. From a comparison of the growth kinetics and the optical properties of films obtained under continuous and modulated discharges we conclude that nanoparticle deposition can take place even when the discharge is on. The implications of these discoveries on the properties of hydrogenated amorphous silicon are discussed in the framework of previous studies where we showed that low defect density and well relaxed films are deposited under conditions where nanoparticles and powders are formed in the discharge. The improved properties in these films are attributed to the incorporation of nanoparticles. (C) 1996 American Vacuum Society.
引用
收藏
页码:655 / 659
页数:5
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共 23 条
  • [1] Plasma particle interactions
    Boeuf, J. P.
    Belenguer, Ph
    Hbid, T.
    [J]. PLASMA SOURCES SCIENCE & TECHNOLOGY, 1994, 3 (03) : 407 - 417
  • [2] PARTICLE GENERATION AND BEHAVIOR IN A SILANE-ARGON LOW-PRESSURE DISCHARGE UNDER CONTINUOUS OR PULSED RADIOFREQUENCY EXCITATION
    BOUCHOULE, A
    PLAIN, A
    BOUFENDI, L
    BLONDEAU, JP
    LAURE, C
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 70 (04) : 1991 - 2000
  • [3] BOUCHOULE A, IN PRESS J APPL PHYS
  • [4] MEASUREMENTS OF PARTICLE-SIZE KINETICS FROM NANOMETER TO MICROMETER SCALE IN A LOW-PRESSURE ARGON-SILANE RADIOFREQUENCY DISCHARGE
    BOUFENDI, L
    PLAIN, A
    BLONDEAU, JP
    BOUCHOULE, A
    LAURE, C
    TOOGOOD, M
    [J]. APPLIED PHYSICS LETTERS, 1992, 60 (02) : 169 - 171
  • [5] Particle nucleation and growth in a low-pressure argon-silane discharge
    Boufendi, L.
    Bouchoule, A.
    [J]. PLASMA SOURCES SCIENCE & TECHNOLOGY, 1994, 3 (03) : 262 - 267
  • [6] Cabarrocas P. R. I., 1993, J NONCRYST SOLIDS, V164-166, P37
  • [7] OPTICAL AND ELECTRONIC-PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON FILMS DEPOSITED BY SQUARE-WAVE MODULATED RF DISCHARGES OF SILANE-HE MIXTURES
    CABARROCAS, PRI
    LLORET, A
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 58 (04): : 365 - 369
  • [8] CHOI SJ, 1993, J APPL PHYS, V74, P823
  • [9] FLUCTUATIONS OF THE CHARGE ON A DUST GRAIN IN A PLASMA
    CUI, CS
    GOREE, J
    [J]. IEEE TRANSACTIONS ON PLASMA SCIENCE, 1994, 22 (02) : 151 - 158
  • [10] CUNIOT M, IN PRESS J NONCRYST