Anomaly of X-ray diffraction profile in single-walled carbon nanotubes

被引：58

作者：

Maniwa, Y ^{[1
]}

Kumazawa, Y

Saito, Y

Tou, H

Kataura, H

Ishii, H

Suzuki, S

Achiba, Y

Fujiwara, A

Suematsu, H

机构：

[1] Tokyo Metropolitan Univ, Dept Phys, Hachioji, Tokyo 1920397, Japan

[2] Tokyo Metropolitan Univ, Dept Chem, Hachioji, Tokyo 1920397, Japan

[3] Univ Tokyo, Dept Phys, Bunkyo Ku, Tokyo 1130033, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1999年 / 38卷 / 6AB期

关键词：

carbon nanotube; XRD; nanostructure; adsorbate; adsorption; resistivity;

D O I：

10.1143/JJAP.38.L668

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

X-ray diffraction (XRD) studies on single-walled carbon nanotube (SWNT) samples prepared by the arc-dischage method were reported. The XRD profile was basically explained to be a result of triangular packing of SWNTS with a lattice constant of 17.1 Angstrom and an average nanotube radius of 7.1 Angstrom. We found an anomalous change in XRD profiles before and after heat-treatment of the SWNT samples in air at similar to 350 degrees C. Combined with gravimetric measurements and resistivity; measurements, a detailed simulation of the XRD profiles showed that air (oxygen, and/or nitrogen and/or water) can be condensed inside:the SWNTs.

引用

页码：L668 / L670

页数：3

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