Application of Pulsed X-ray Induced Partial Discharge Measurements

被引:20
作者
Adili, Sedat [1 ]
Franck, Christian M. [1 ]
机构
[1] ETH, Power Syst & High Voltage Labs, CH-8092 Zurich, Switzerland
关键词
partial discharges; insulation testing; attenuation measurement; x-ray applications; x-ray measurements; SIMULATION;
D O I
10.1109/TDEI.2012.6311534
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The use of short x-ray pulses (duration 50 ns) has shown to eliminate the statistical time lag by providing start electrons for the partial discharge (PD) development in a void, making it possible to detect very small voids at low electric field levels. A single x-ray pulse of a given dose produces a certain number of electron-ion pairs in a given gas volume, depending on the gas parameters. A minimum x-ray dose is thus needed to provide at least one start electron in the void for successful pulsed x-ray induced partial discharge (PXIPD) inception. In the application of x-rays to a conventional PD measurement, it is necessary to consider that photons emitted by the x-ray source are attenuated by every barrier material which is located between the source and the void of the insulator. This paper presents guidelines on how to design a successful PXIPD measurement with any given pulsed x-ray source. To do so, the theoretical background of PDs and the attenuation phenomena of x-ray are shown. The minimum x-ray dose for PD inception in artificially produced spherical voids is determined experimentally and evaluated theoretically.
引用
收藏
页码:1833 / 1839
页数:7
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