Characteristic temperature dependence of the maximum Josephson current in Bi-Sr-Ca-Cu-O intrinsic junctions

被引：9

作者：

Suzuki, M

Watanabe, T

Matsuda, A

机构：

[1] NTT, Basic Res Labs, Tokai, Ibaraki 3191193, Japan

[2] NTT, Basic Res Labs, Kanagawa 2430198, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1999年 / 9卷 / 02期

关键词：

D O I：

10.1109/77.784028

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have measured the temperature dependence of the maximum Josephson current I(c) for 15 - 30 nm thick stacks comprised of 10 to 20 Bi(2)Sr(2)CaCu(2)O(8+delta) intrinsic junctions. It is found that I(c) typically shows little saturation at low temperatures but continues to increase noticeably as temperature decreases towards T = 0. This behavior becomes significant as the normal tunneling resistance increases with decreasing oxygen content.

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页码：4511 / 4514

页数：4

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