In-situ grazing incidence X-ray diffractometry observation of pitting corrosion of copper in chloride solutions

被引：47

作者：

Sathiyanarayanan, S ^{[1
]}

Sahre, M ^{[1
]}

Kautek, W ^{[1
]}

机构：

[1] Fed Inst Mat Res & Testing, Lab Thin Film Technol, D-12205 Berlin, Germany

来源：

CORROSION SCIENCE | 1999年 / 41卷 / 10期

关键词：

copper; passive films; fitting corrosion; cyclic voltammetry; XRD;

D O I：

10.1016/S0010-938X(99)00021-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In-situ Grazing Incidence X-Ray Diffractometry (in-situ GIXD) by means of common laboratory equipment, in combination with a potentiostated three-electrode cell, revealed the conversion film dynamics during the alkaline chloride pitting action on copper. Several hours of oxidation in the potential range of Cu(OH)(2) formation resulted in the formation of crystalline CuCl and Cu2O. The attack of chloride ions initially replaces the outer amorphous Cu(OH)(2) layer. forming soluble CuCl2. Then the chloride ions start replacing the oxygen in the Cu2O layer, forming a CuCl phase. At transient times, only CuCl occurs before corrosion currents increase due to copper dissolution and crystalline Cu2O formation. Ultrasonic treatment shows that CuCl has poor adhesion, whereas Cu2O crystals persist at the pitted copper surface. (C) 1999 Elsevier Science Ltd. All rights reserved.

引用

页码：1899 / 1909

页数：11

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