Identification of a major QTL for yellow leaf spot resistance in the wheat varieties Brookton and Cranbrook

被引：36

作者：

Cheong, J ^{[1
]}

Wallwork, H ^{[1
]}

Williams, KJ ^{[1
]}

机构：

[1] S Australian Res & Dev Inst, Cooperat Res Ctr Mol Plant Breeding, Urrbrae, SA 5064, Australia

来源：

AUSTRALIAN JOURNAL OF AGRICULTURAL RESEARCH | 2004年 / 55卷 / 03期

关键词：

Triticum aestivum; disease resistance; microsatellite; marker-assisted selection;

D O I：

10.1071/AR03140

中图分类号：

S [农业科学];

学科分类号：

09 ;

摘要：

Yellow leaf spot (YLS) or tan spot, caused by Pyrenophora tritici-repentis, is a major foliar disease of wheat. A bioassay was used to identify YLS seedling resistance phenotypes of Krichauff/Brookton and Cranbrook/Halberd doubled-haploid (DH) populations. Bulked-segregant analysis was used to identify amplified fragment length polymorphism (AFLP) markers linked to a YLS resistance locus in the wheat cultivar Brookton. Three AFLPs were linked to YLS resistance and also to each other. One of these AFLPs was mapped to the interval Xbcd351-Xcdo400, which has been assigned to chromosome 5BL. Microsatellite markers in this region were selected from several maps and were genotyped on the Krichauff/Brookton population. Together with the bulked segregant analysis (BSA)-derived AFLPs, the microsatellite markers explained up to 39% of the total phenotypic variation (logarithm of odds ratio, LOD greater than or equal to 7.32), confirming the chromosome 5BL assignment of a Brookton YLS resistance locus, at or near the previously identified Pyrenophora tritici-repentis toxin-insensitivity locus tsn1. The marker - trait linkage was validated in the Cranbrook/Halberd DH population, in which the same microsatellite markers explained up to 60% of the total trait variance for YLS. The markers identified can be used for the selection of the Brookton and Cranbrook YLS seedling resistance locus on chromosome 5B.

引用

页码：315 / 319

页数：5

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