Microwave surface resistance of YBa2Cu3O7-delta films on polycrystalline alumina and Ni-based alloy substrates with ion-beam-assisted-deposited buffer layers

被引：2

作者：

Findikoglu, AT

Arendt, PN

Groves, JR

Foltyn, SR

Peterson, EJ

Reagor, DW

Jia, QX

机构：

[1] MS K763, Materials Science and Technology Division Los Alamos National Laboratory, Los Alamos

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期

关键词：

D O I：

10.1109/77.620735

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We measured the microwave surface resistance R-s of superconducting YBa2Cu3O7-x (YBCO) films on buffered polycrystalline alumina and Ni-based alloy substrates using parallel-plate technique, We observed a strong correlation between the low-power R-s and the in-plane mosaic spread of the YBCO films. A 0.4-mu m-thick YBCO film with an in-plan mosaic spread of 6.6 degrees (7 degrees) on a buffered polycrystalline Ni-based alloy (buffered polycrystalline alumina) substrate showed an R-s of 0.51 m Omega (1.89 m Omega) at 76 K and 0.17 m Omega (0.21 m Omega) at 4 K.

引用

页码：1232 / 1235

页数：4

共 17 条

[1]

ARENDT P, 1994, MATER RES SOC SYMP P, V341, P209, DOI 10.1557/PROC-341-209

[2]

CASTEL X, 1995, PHYSICA C, V255, P1866

[3] MICROWAVE SURFACE-RESISTANCE OF EPITAXIAL YBA2CU3O7 THIN-FILMS ON SAPPHIRE [J].