High f(max) n-type Si/SiGe MODFETs

被引:32
作者
Gluck, M [1 ]
Hackbarth, T [1 ]
Konig, U [1 ]
Haas, A [1 ]
Hock, G [1 ]
Kohn, E [1 ]
机构
[1] UNIV ULM,DEPT ELECTRON DEVICES & CIRCUITS,D-89081 ULM,GERMANY
关键词
MODFET; field effect transistors;
D O I
10.1049/el:19970198
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors report on the fabrication of 0.18 mu m gale length n-type Si/Si60Ge40 modulation-doped field-effect transistors (MODFETs) with improved RF performance. The 2D electron gas channel, a strained Si layer grown on a relaxed 2 mu m thick graded Si60Ge40 buffer shows high mobility (mu = 1190cm(2)/Vs at room temperature). High DC transconductances (up to 270mS/mm at room temperature), high saturation currents (260mA/mm) due to reduced parasitic series resistances (R-S less than or equal to 0.2 Omega mm) and high carrier densities (n(s) = 1.9 x 10(12)cm(-2)) are achieved. Very good RF characteristics have been found for the non-recessed device structure with cutoff frequencies up to f(T) = 46GHz and a record of f(max) = 81GHz at low supply voltages around 1.5V.
引用
收藏
页码:335 / 337
页数:3
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