Ultra sharp crystalline silicon tip array used as field emitter

被引:18
作者
Mehr, W
Wolff, A
Frankenfeld, H
Skaloud, T
Hoppner, W
Bugiel, E
Larz, J
Hunger, B
机构
[1] Inst. Semiconduct. Phys. F., 15230 Frankfurt (Oder)
关键词
D O I
10.1016/0167-9317(95)00271-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article describes the fabrication of single crystal silicon field emission tip arrays. Each array consists of 2500 tips. We used 4 in. (100) oriented n type silicon wafers 0.008 - 0.020 Omega cm, Sb doped. The tips were formed using a RIE process. We achieved crystalline emitter tip radiuses of 1.5 - 2 nm. The extraction yid is a self aligned, sputter deposited Ti-0.1 W-0.9 film. The radiuses of the extraction grid apertures range from 300 to 150 nm and have a tip to tip spacing from 10 to 5 mu m. The testing was done in vacuum with a distance of 500 mu m between extraction grid and anode. We have seen maximum stable array currents up to 2 mu A An anode current of 10 nA was initially detected at minimal gate bias of about 14 V.
引用
收藏
页码:395 / 398
页数:4
相关论文
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