Fabrication and characterization of an InGaAsp/InP active waveguide optical isolator with 14.7 dB/mm TE mode nonreciprocal attenuation

被引:85
作者
Shimizu, H [1 ]
Nakano, Y
机构
[1] Univ Tokyo, Res Ctr Adv Sci & Technol, Tokyo 1538904, Japan
[2] Japan Sci & Technol Agcy, SORST, Tokyo 1538904, Japan
关键词
Fe; InGaAsP; nonreciprocal loss shift; photonic integrated circuit; semiconductor optical amplifiers; waveguide optical isolator;
D O I
10.1109/JLT.2005.861135
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors have fabricated transverse electric (TE) mode InGaAsP/InP active waveguide optical isolators based on the nonreciprocal loss shift and demonstrated improved TE mode isolation ratio of 14.7 dB/mm with reduced insertion loss at a wavelength of 1550 nm for monolithically integrable optical isolators. The wavelength dependence of the isolation ratio and the propagation loss were also measured. An isolation ratio greater than 10 dB/mm was realized over the entire wavelength range of 1530-1560 nm. These results lead to the monolithic integration of semiconductor waveguide optical isolators with edge-emitting semiconductor lasers and highly functional photonic integrated circuits with many cascaded optical devices.
引用
收藏
页码:38 / 43
页数:6
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