Structure of ultrathin crystalline SiO2 films on Mo(112) -: art. no. 161307

被引:29
作者
Ricci, D [1 ]
Pacchioni, G [1 ]
机构
[1] Univ Milano Bicocca, Inst Nazl Fis Mat, Dipartimento Sci Mat, I-20125 Milan, Italy
关键词
D O I
10.1103/PhysRevB.69.161307
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The geometrical and electronic structures of a thin SiO2 film epitaxially grown on a Mo(112) substrate have been determined by first-principles density-functional theory calculations. beta-cristobalite, beta-tridymite, alpha-quartz, and beta-quartz phases were considered. The film grows initially with an OH-terminated beta-cristobalite structure which provides the strongest adhesion energy to the Mo substrate. High-temperature annealing results in a complete dehydroxylation and reconstruction of the top layer of the cristobalite film with the formation of two-membered silica rings. This accounts for a specific band at 795 cm(-1) observed in the Fourier transform infra-red (FTIR) spectrum of the annealed epilayer.
引用
收藏
页码:161307 / 1
页数:4
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