Wear mechanisms in reciprocal scratching of polycarbonate, studied by atomic force microscopy

被引：47

作者：

Khurshudov, A ^{[1
]}

Kato, K ^{[1
]}

机构：

[1] TOHOKU UNIV, FAC ENGN, LAB TRIBOL, SENDAI, MIYAGI 98077, JAPAN

来源：

WEAR | 1997年 / 205卷 / 1-2期

关键词：

atomic force microscopy; polycarbonate; microwear; apparent volume increase;

D O I：

10.1016/0043-1648(95)06893-7

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

An atomic farce microscope (AFM) was used to study the microwear process of polycarbonate (PC). Testing included multiple scratching (scan-scratching) and line-scratching using a microfabricated Si3N4 AFM tip of 10-20 nm radius. Interfacial adhesion, friction, the effect of number of cycles, scratching speed and the interaction of scratches were studied. Unlike previous reports, projections as a result of polycarbonate volume increase were observed after reciprocal scratching on the same track (without AFM tip lateral feed). In spite of analytically predicted elastic/plastic contact, no plastic deformation was found during the tests. A model, based on the cracks formation and growth process was suggested to explain these phenomena. The importance of lateral feed in the process of wear particles formation was shown. No scratching speed effect on friction or microwear was found.

引用

页码：1 / 10

页数：10

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