Emissivity measurement and temperature correction accuracy considerations

被引:70
作者
Madding, RP [1 ]
机构
[1] Inframetr Inc, Billerica, MA 01821 USA
来源
THERMOSENSE XXI | 1999年 / 3700卷
关键词
D O I
10.1117/12.342307
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Extraction of temperatures or temperature differences with thermography is not possible without knowledge of the target emissivity. As the technology of thermography evolves, many applications from predictive maintenance through R&D projects have increasingly stringent requirements for quality temperature measurement. Today's IR cameras and software can correct for target emissivity variations on a point-by-point basis or over the entire image. One problem is how to measure emissivity, and how emissivity measurement uncertainties propagate to temperature uncertainties. This paper discusses emissivity measurement techniques, why table values are often not valid for a particular IR camera (why you must measure emissivity) and how emissivity measurement accuracy affects temperature measurement accuracy (error budget far opaque targets).
引用
收藏
页码:393 / 401
页数:9
相关论文
共 4 条
  • [1] DOEBELIN EO, 1975, MEASUREMENT SYSTEMS
  • [2] JOHNSON R, 1988, THERMOSENSE 10, V934, P202
  • [3] MADDING RP, 1989, HDB APPL THERMAL DES, pCH8
  • [4] MADDING RP, 1982, THERMOSENSE, V5