Improved interferometric method to measure near-carrier AM and PM noise

被引：15

作者：

Rubiola, E ^{[1
]}

Giordano, V

Groslambert, J

机构：

[1] Politecn Torino, I-10129 Turin, Italy

[2] CNRS, LPMO, F-25044 Besancon, France

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1999年 / 48卷 / 02期

关键词：

AM noise; correlation; phase noise; random noise;

D O I：

10.1109/19.769677

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An improved version of the interferometric method to measure near-carrier AM and PM noise is being presented. The main feature of this scheme is the capability to reduce the instrument noise by correlating the output of two equal interferometers built around the same device to be tested, thus enhancing the sensitivity. Two double interferometers are described, operating in the microwave and VHF bands. The latter shows a noise floor of -194 dB rad(2)/Hz when the signal power is + 8 dBm. The sensitivity of both the instruments turns out to be significantly higher than the ratio of the thermal noise divided by the carrier power.

引用

页码：642 / 646

页数：5

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