Confocal Raman micro spectroscopy: Calculation of corrected depth profiles of wet-chemically modified polymer films

被引:6
作者
Gallardo, A
Spells, S
Navarro, R
Reinecke, H
机构
[1] CSIC, Inst Ciencia & Tecnol Polimeros, E-28006 Madrid, Spain
[2] Sheffield Hallam Univ, Mat & Engn Res Inst, Sheffield S1 1WB, S Yorkshire, England
关键词
diffraction; modification; Raman spectroscopy; refraction; surfaces;
D O I
10.1002/marc.200500851
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 [高分子化学与物理]; 080501 [材料物理与化学]; 081704 [应用化学];
摘要
A mathematical approach developed to correct depth profiles of wet-chemically modified polymer films obtained by confocal Raman microscopy is presented which takes into account scattered contributions originated from a diffraction-limited laser focal volume and the refractive index of the sample. The method is demonstrated in both virtual and real samples where it is shown that considerable differences between apparent and corrected depth profiles exist at the surface, especially when profiles with strong concentration gradients are dealt with or an instrument with poor depth resolution is used.
引用
收藏
页码:529 / 536
页数:8
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