Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide

被引：60

作者：

Abbas, Z ^{[1
]}

Pollard, RD

Kelsall, RW

机构：

[1] Univ Leeds, Sch Elect & Elect Engn, Leeds, W Yorkshire, England

[2] Univ Leeds, Inst Microwaves & Photon, Leeds, W Yorkshire, England

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2001年 / 50卷 / 05期

关键词：

calibration; complex permittivity; dielectric measurement; dielectric waveguide; microwave measurements; optimization method; permittivity measurement;

D O I：

10.1109/19.963207

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented.

引用

页码：1334 / 1342

页数：9

共 23 条

[1]

Determination of the dielectric constant of materials from effective refractive index measurements [J].