Epitaxial growth of thin films of SrTi1-xRuxO3-delta by pulsed laser deposition

被引:13
作者
Gupta, A
Hussey, BW
Shaw, TM
机构
[1] IBM Research Division, T.J. Watson Research Center, Yorktown Heights
关键词
oxides; laser deposition; X-ray diffraction; electrical properties; magnetic properties;
D O I
10.1016/S0025-5408(96)00148-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The pulsed laser deposition technique has been utilized for thin film synthesis of a continuous series of solid solutions of the end member perovskite compounds SrTiO3 and SrRuO3. The SrTi1-xRuxO3-d (0 less than or equal to x less than or equal to 1) films are grown epitaxially on (100)-oriented SrTiO3 substrates in a low pressure atomic oxygen ambient with in situ monitoring using reflection high-energy electron diffraction (RHEED). The as-deposited films are cubic or pseudocubic over the whole composition range with the lattice parameter increasing continuously with increasing Ru4+ substitution. Correspondingly, the resistivity evolves from insulating to metallic behavior. The solid solution films are potentially useful as latticed-matched buffer layers for heteroepitaxial growth, or as barrier layers in tunnel junctions with controlled resistive properties.
引用
收藏
页码:1463 / 1470
页数:8
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