Characterisation of sol-gel crystallineV2O5 thin films after Li intercalation cycling

Thin sol-gel V2O5 films were examined before and after lithium electrochemical intercalation/deintercalation cycles. X-ray photoelectron spectroscopy (XPS) was used for surface characterisation, while microstructure and morphological characteristics were studied by atomic force and electron microscopies (AFM, SEM and TEM). Microscopy showed the film, as prepared, to be highly crystalline, having a layered structure and spectroscopy showed good stoichiometry and few impurities. Electrochemical cycling and rinsing for analysis leads, eventually, to porosity and decrease in film thickness, probably through degradation of grain boundaries. Copyright (C) 2006 John Wiley & Sons, Ltd.