Smooth discrete track media fabricated by focused ion beam

被引:27
作者
Pang, BSH [1 ]
Chen, YJ [1 ]
Leong, SH [1 ]
机构
[1] Data Storage Inst, Singapore 117608, Singapore
关键词
D O I
10.1063/1.2169851
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have successfully fabricated discrete track media reproducibly using the focused ion beam (FIB). 1 pA and 10 pA FIB beam currents were used effectively for discrete track fabrication; at Ga+ doses of similar to 4.2x10(16) ions/cm(2) and below, media magnetic properties are effectively suppressed, whilst damage to the morphology was minimal. Larger land/groove magnetic contrast was achieved through increasing the ion bombardment rates within this range. Beyond this dosage range, magnetic suppression leveled out, and physical grooves were etched in the media.
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页数:3
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