Characterization of SET electrometer coupled to the quantum dot in GaAs AlGaAs 2DEG

被引：2

作者：

Ishibashi, K ^{[1
]}

Ida, T

Kotani, H

Ochiai, Y

Sugano, T

Aoyagi, Y

机构：

[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan

[2] Chiba Univ, Dept Mat Sci, Inage Ku, Chiba 263, Japan

来源：

MICROELECTRONIC ENGINEERING | 1999年 / 47卷 / 1-4期

关键词：

D O I：

10.1016/S0167-9317(99)00185-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The SET electrometer has been fabricated in GaAs/AlGaAs 2 dimensional electron gas (2DEG), and has been coupled to the quantum dot to measure the change in electron number in it. When the coupling strength was enough large, the signal to indicate the electron number change was confirmed by simultaneously measuring two currents in the SET and the dot.

引用

页码：185 / 187

页数：3

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