Interface stress in polycrystalline materials: The case of nanocrystalline Pd

被引：43

作者：

Birringer, R ^{[1
]}

Hoffmann, M ^{[1
]}

Zimmer, P ^{[1
]}

机构：

[1] Univ Saarland, D-66041 Saarbrucken, Germany

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 88卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.88.206104

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Based on a generalization of a capillary equation for solids, we develop a method for measuring the absolute value of grain-boundary stress in polycrystalline samples having a large interface-to-volume ratio. The grain-boundary stress in nanocrystalline Pd is calculated from x-ray diffraction measurements of the average grain size and the residual-strain-free lattice spacings, yielding a value of 1.2+/-0.1 N/m . The random distribution of crystallite orientations in the sample suggests that this value is characteristic of high-angle grain boundaries in Pd.

引用

页数：4

共 32 条

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[2]

CAHN JW, 1987, INTERFACIAL SEGREGAT, P3

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