共 20 条
- [1] ORIENTATION IMAGING - THE EMERGENCE OF A NEW MICROSCOPY [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1993, 24 (04): : 819 - 831
- [2] Dingley D., 2000, ELECT BACKSCATTER DI, P1
- [3] DINGLEY DJ, 1981, SCAN ELECTRON MICROS, P273
- [4] Giannuzzi L. A., 2000, MICROSCOPY MICROA S2, V6, P508
- [5] Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation [J]. SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY OF MATERIALS IV, 1997, 480 : 19 - 27
- [6] Giannuzzi LA, 1998, MICROSC RES TECHNIQ, V41, P285, DOI 10.1002/(SICI)1097-0029(19980515)41:4<285::AID-JEMT1>3.0.CO
- [7] 2-Q
- [8] GIGNAC LM, 2000, ASM 2000 ST LOUIS MO
- [9] GOLDSTEIN JI, 1992, SCANNING ELECT MICRO, P76
- [10] ACCURATE MICROCRYSTALLOGRAPHY AT HIGH SPATIAL-RESOLUTION USING ELECTRON BACKSCATTERING PATTERNS IN A FIELD-EMISSION GUN SCANNING ELECTRON-MICROSCOPE [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1981, 14 (02): : 175 - 182