Atomic background in 4p elements

被引：2

作者：

Gomilsek, JP

Kodre, A

Arcon, I

Loireau-Lozac'h, AM

Bénazeth, S

机构：

[1] Fac Mech Engn, Maribor 2000, Slovenia

[2] Univ Ljubljana, Fac Math & Phys, Ljubljana 61000, Slovenia

[3] Sch Environm Sci, Nova Gorica, Slovenia

[4] Univ Paris 05, Fac Sci Pharmaceut & Biol, F-75270 Paris 06, France

[5] Univ Paris 11, Lab LURE, F-91405 Orsay, France

[6] Univ Paris 05, Fac Pharm, F-75270 Paris 06, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 1999年 / 6卷

关键词：

atomic absorption background; multielectron photoexcitations; chalcogenide glasses; 4p elements EXAFS;

D O I：

10.1107/S0909049598017166

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the 4p elements from Ga to Kr the atomic background is determined by removing the structural component From simple EXAFS spectra of chalcogenide glasses, solutions and vapors. The background comprises sharp features due to 1s3d and 1s3p multielectron photoexcitations, such as found in the atomic absorption spectrum of gaseous krypton. A spline background, generated by the FEFF "autobk" routine accounts properly for the long-wavelength components, but misses the sharp details of the amplitude of similar to 1% of the K edge jump. This is sufficient to spoil the structural parameters in EXAFS analysis in some cases.

引用

页码：304 / 305

页数：2

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