Methods in determination of morphological degradation of polymer:fullerene solar cells

被引:18
作者
Turkovic, Vida [1 ]
Engmann, Sebastian [1 ]
Gobsch, Gerhard [1 ]
Hoppe, Harald [1 ]
机构
[1] Tech Univ Ilmenau, Inst Phys, D-98693 Ilmenau, Germany
关键词
Morphology; Degradation; UV-Vis spectroscopy; Atomic force microscopy; Optical microscopy; Photoluminescence; P3HT; PCBM; Bulk heterojunction; Thermal annealing; 3-DIMENSIONAL NANOSCALE ORGANIZATION; BULK HETEROJUNCTION POLYMER; PHASE-SEPARATION; PERFORMANCE; NANOMORPHOLOGY; DERIVATIVES; STABILITY; BLENDS; FILMS;
D O I
10.1016/j.synthmet.2011.09.014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The changes in the blend morphology of the thin films accelerate when thermally annealed at increased temperatures. Tapping-mode atomic force microscopy (AFM) measurements provide deeper insight into the nano- and micro-meter scale of the phase separation observable on the surface of the film. Furthermore, to prove the coarsening of phase separation on various length scales, optical microscopy, UV-Vis, photoluminescence and measurements were conducted. Of special interest is tracking down the formation of fullerene aggregates and correlation of their growth in time. We demonstrate ways to detect characteristic stages of phase separation directly using simple optical measurements. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:2534 / 2539
页数:6
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