Rietveld analysis of X-ray diffraction pattern from β-Ta2O5 oxide

被引：108

作者：

Aleshina, LA ^{[1
]}

Loginova, SV ^{[1
]}

机构：

[1] St Petersburg State Univ, Petrozavodsk 185640, Karelia, Russia

来源：

CRYSTALLOGRAPHY REPORTS | 2002年 / 47卷 / 03期

关键词：

Oxide; Diffraction Pattern; Thermal Parameter; Orthorhombic Structure; Rietveld Analysis;

D O I：

10.1134/1.1481927

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The structure of low-temperature beta-Ta2O5 oxide has been studied by the method of Rietveld full-profile analysis. It is established that this oxide has an orthorhombic structure with lattice parameters a = 6.217 Angstrom, b = 3.677 Angstrom, and c = 7.794 Angstrom. The atomic coordinates and thermal parameters are also determined. (C) 2002 MAIK "Nauka/Interperiodica".

引用

页码：415 / 419

页数：5

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