The growth and morphology of epitaxial multilayer graphene

被引:741
作者
Hass, J. [1 ]
de Heer, W. A. [1 ]
Conrad, E. H. [1 ]
机构
[1] Georgia Inst Technol, Atlanta, GA 30332 USA
关键词
D O I
10.1088/0953-8984/20/32/323202
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The electronic properties of epitaxial graphene grown on SiC have shown its potential as a viable candidate for post-CMOS electronics. However, progress in this field requires a detailed understanding of both the structure and growth of epitaxial graphene. To that end, this review will focus on the current state of epitaxial graphene research as it relates to the structure of graphene grown on SiC. We pay particular attention to the similarity and differences between graphene growth on the two polar faces, (0001) and (000 (1) over bar), of hexagonal SiC. Growth techniques, subsequent morphology and the structure of the graphene/SiC interface and graphene stacking order are reviewed and discussed. Where possible the relationship between film morphology and electronic properties will also be reviewed.
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页数:27
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