Electronic and geometric structure of thin stable short silicon nanowires

被引:84
作者
Li, BX [1 ]
Cao, PL
Zhang, RQ
Lee, ST
机构
[1] Zhejiang Univ, Dept Phys, Hangzhou 310027, Peoples R China
[2] Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
[3] City Univ Hong Kong, Ctr Super Diamond & Adv Films, Hong Kong, Hong Kong, Peoples R China
[4] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R China
关键词
D O I
10.1103/PhysRevB.65.125305
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using the full-potential linear-muffin-tin-orbital molecular-dynamics method, we have studied the geometric and electronic structures of thin short silicon nanowires consisting of tricapped trigonal prism Si-9 subunits and uncapped trigonal prisms, respectively. Comparing to other possible structures, these structures are found to be the thinnest stable silicon nanowires, being particularly much more stable than the silicon nanotubes built analogously to small carbon nanotubes. As for their electronic structures, these silicon wires show very small gaps of only a few tenths of an eV between the lowest unoccupied energy level and the highest occupied energy level, and the gaps decrease as the stacked layers increase. The results provide guidance to experimental efforts for assembling and growing silicon nanowires.
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页码:1 / 6
页数:6
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