Systematic study of the size and spacing dependence of Ag nanoparticle enhanced fluorescence using electron-beam lithography

被引:41
作者
Corrigan, TD [1 ]
Guo, SH
Szmacinski, H
Phaneuf, RJ
机构
[1] Univ Maryland, Dept Mat Sci & Engn, College Pk, MD 20742 USA
[2] Univ Maryland, Lab Phys Sci, College Pk, MD 20742 USA
[3] Microcosm Inc, Columbia, MD 21046 USA
关键词
D O I
10.1063/1.2176862
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the enhancement of fluorescence by Ag nanopillars on a semiconducting substrate in which the pillar size, shape, and spacing is varied systematically using electron-beam lithography. Local maxima in the enhancement versus lateral size, as large as a factor of similar to 20 are observed, and vary both with the shape of the pillars and the wavelength of the excitation. We find that the size, shape, and spacing dependence is in qualitative agreement with a model based upon resonant coupling with particle plasmon polaritons. We also find increased enhancement for particle shapes producing high local electric fields. (c) 2006 American Institute of Physics.
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页数:3
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