X-ray refraction-enhanced imaging and a method for phase retrieval for a simple object

被引：79

作者：

Suzuki, Y ^{[1
]}

Yagi, N ^{[1
]}

Uesugi, K ^{[1
]}

机构：

[1] JASRI, SPring 8, Mikazuki, Hyogo 6795198, Japan

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2002年 / 9卷

关键词：

refraction contrast; phase contrast; phase retrieval; tomography;

D O I：

10.1107/S090904950200554X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Refraction-enhanced imaging is now widely used for imaging low-absorption-contrast specimens in the hard X-ray region. However, the interpretation of the details of a refraction-enhanced image is not always clear. In this paper the theoretical treatment of refraction-enhanced imaging and a method for phase retrieval from refraction-contrast images are discussed in comparison with angular-deflection mapping of the transmitting beam. The problems of thick and complicated objects are also discussed.

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收藏

页码：160 / 165

页数：6

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