SANS-II at SINQ: installation of the former Riso-SANS facility

被引：62

作者：

Strunz, P. ^{[1
,2
]}

Mortensen, K. ^{[3
]}

Janssen, S. ^{[1
,2
]}

机构：

[1] Paul Scherrer Inst, Neutron Scattering Lab, CH-5232 Villigen, Switzerland

[2] Swiss Fed Inst Technol, CH-5232 Villigen, Switzerland

[3] Riso Natl Lab, DK-4000 Roskilde, Denmark

来源：

PHYSICA B-CONDENSED MATTER | 2004年 / 350卷 / 1-3期

关键词：

Small-angle neutron scattering; Neutron scattering instrumentation; Neutron wavelength; Raw-data treatment;

D O I：

10.1016/j.physb.2004.03.204

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

SANS-II facility at SINQ (Paul Scherrer Institute)-the reinstalled former Riso small-angle neutron scattering instrument-is presented. Its operational characteristics are listed. Approaches for precise determination of wavelength, detector dead time and attenuation factors are described as well. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：E783 / E786

页数：4

共 3 条

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[2]

Keiderling U., 1997, PHYSICA B, V234-236, P1111

[3] General formula for determination of cross-section from measured SANS intensities [J].

Strunz, P ;

Saroun, J ;

Keiderling, U ;

Wiedenmann, A ;

Przenioslo, R .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 (01) :829-833

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