Inhomogeneous strains in semiconducting nanostructures

被引:4
作者
Gippius, NA [1 ]
Tikhodeev, SG [1 ]
机构
[1] Russian Acad Sci, Inst Gen Phys, Moscow 117942, Russia
关键词
D O I
10.1134/1.558888
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have developed a numerical technique for calculating inhomogeneous strains in stressed semiconducting nanostructures, such as quantum wires and dots manufactured by nanolithography from stressed InGaAs/GaAs quantum wells. The technique is based on solving a linear problem of elasticity theory by the Green's function method and presumes a lack of defects and dislocations in nanostructure heterojunctions. Spatial distributions of strain tensor components and shifts of electron and hole potentials in a nanostructure due to the strain have been calculated. (C) 1999 American Institute of Physics. [S1063-7761(99)02705-5].
引用
收藏
页码:1045 / 1049
页数:5
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