A Specific Data Acquisition Scheme for Electrical Tomography

被引:24
作者
Cui, Ziqiang [1 ]
Wang, Huaxiang [1 ]
Tang, Lei [1 ]
Zhang, Lifeng [1 ]
Chen, Xiaoyan [1 ,2 ]
Yan, Yong [3 ]
机构
[1] Tianjin Univ, Sch Elect Engn & Automat, Tianjin 300072, Peoples R China
[2] Tianjin Univ Sci & Technol, Sch Elect Informat & Automat, Tianjin 300222, Peoples R China
[3] Univ Kent, Dept Elect, Canterbury CT2 7NT, Kent, England
来源
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2008年
基金
中国国家自然科学基金;
关键词
electrical tomography; multimodal measurement; data acquisition; field programmable gate arrays;
D O I
10.1109/IMTC.2008.4547132
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electrical tomography techniques have been developed for monitoring the internal behavior of industrial processes. The electrical tomography offers some advantages over other tomography modalities, such as low cost, no radiation and being non-intrusive. In the past, individual data acquisition systems have been used for tomographic measurement, e.g., for ECT, ERT and EMT, most of which are in analog hardware. Generally, it is difficult to transfer these systems to other modalities. This paper presents a FPGA based data acquisition scheme, which can be used to facilitate the hardware design of electrical tomography. Improvements in system performance are achieved by implementing most functions in digital rather than analog hardware. Currently, individual ECT and ERT data acquisition systems have been used for achieving dual-modality tomography, which will result in poor hardware integration and data combination. With this scheme, multi-modality measurement techniques could be integrated into a system based on a single FPGA chip, providing effective integration. Preliminary results show that the signal to noise ratio is greater than 74dB.
引用
收藏
页码:726 / +
页数:2
相关论文
共 13 条
[1]  
BUKHARI SFA, 4 WORLD C IND PROC T, P855
[2]   Electrical resistance tomography using a bi-directional current pulse technique [J].
Cilliers, JJ ;
Xie, W ;
Neethling, SJ ;
Randall, EW ;
Wilkinson, AJ .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (08) :997-1001
[3]  
COOK RD, 1992, THESIS RENSSELAER PO
[4]  
CUI ZQ, 2007, THESIS TIANJIN U TIA
[5]  
GEORGAKOPOULOS D, 2002, 2 INT S PROC TOM POL, P47
[6]   Design and application of a multi-modal process tomography system [J].
Hoyle, BS ;
Jia, X ;
Podd, FJW ;
Schlaberg, HI ;
Tan, HS ;
Wang, M ;
West, RM ;
Williams, RA ;
York, TA .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (08) :1157-1165
[7]  
Oh TI, 2003, P ANN INT IEEE EMBS, V25, P1070
[8]   Engineering and application of a dual-modality process tomography system [J].
Qiu, C. ;
Hoyle, B. S. ;
Podd, F. J. W. .
FLOW MEASUREMENT AND INSTRUMENTATION, 2007, 18 (5-6) :247-254
[9]   A pre-iteration method for the inverse problem in electrical impedance tomography [J].
Wang, HX ;
Wang, C ;
Yin, WL .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (04) :1093-1096
[10]   A high-performance EIT system [J].
Wang, M ;
Ma, YX ;
Holliday, N ;
Dai, YF ;
Williams, RA ;
Lucas, G .
IEEE SENSORS JOURNAL, 2005, 5 (02) :289-299